发明名称 LONG CHANNEL MOS TRANSISTORS FOR LOW LEAKAGE APPLICATIONS ON A SHORT CHANNEL CMOS CHIP
摘要 Embodiments of the invention include vertically oriented long channel transistors and methods of forming such transistors. In one embodiment, a method of forming such a transistor may include forming a fin on a semiconductor substrate. Embodiments may also include forming a spacer over an upper portion of the fin and a lower portion of the fin not covered by the spacer may be exposed. Embodiments may also include forming a gate dielectric layer over the exposed portion of the fin. A gate electrode may then be deposited, according to an embodiment. Embodiments may include exposing a top portion of the fin and forming a first source/drain (S/D) region in the top portion of the fin. The second S/D region may be formed by removing the semiconductor substrate to expose a bottom portion of the fin and forming the second S/D region in the bottom portion of the fin.
申请公布号 WO2017052650(A1) 申请公布日期 2017.03.30
申请号 WO2015US52465 申请日期 2015.09.25
申请人 INTEL CORPORATION;MEHANDRU, Rishabh;MORROW, Patrick;FISCHER, Paul B.;LILAK, Aaron D.;CEA, Stephen M. 发明人 MEHANDRU, Rishabh;MORROW, Patrick;FISCHER, Paul B.;LILAK, Aaron D.;CEA, Stephen M.
分类号 H01L21/8238 主分类号 H01L21/8238
代理机构 代理人
主权项
地址