| 主权项 |
1. A system for testing a gem under test, the system comprising:
a gem tester comprising:
an elongated body having a first end and a second end,a probe extending from the first end of the elongated body,a circuit portion located within the elongated body, the circuit portion being thermo-electrically coupled to the probe to measure conductivity of the gem under test; and a magnifying device for a gem under test selectively attached to the gem tester, the magnifying device comprising:
a body having a proximal end and a distal end,a securing ring coupled to the proximal end of the body, the securing ring inscribed by a collar having a plurality of detention tangs thereon, the collar sized to compliment in fit the elongated body proximate to the first end thereof, the plurality of detention tangs creating a selectively attachable snap-fit engagement between the collar and the elongated body proximate to the first end thereto,a hinge assembly coupled to the distal end of the body, the hinge assembly including spaced first and second hinge pads having a hinge bushing interleaved therebetween, the hinge assembly including a hinge pin traversing the first hinge pad, hinge bushing, and second hinge pad,the hinge assembly including a pivot arm extending from the hinge bushing, the pivot arm transferring rotational bearing force to cause the pivot arm to rotate relative to the body, anda support frame coupled to the pivot arm, the support frame including a seat defining a circular opening securing a magnifying lens therein, the support frame including a pivot blade extending therefrom, the pivot blade accepting rotational bearing force to cause the pivot arm and support frame to rotate relative to the body. |
