发明名称 MEASURING DEVICE AND MEASURING METHOD FOR SYSTEMATIC ERROR DETECTION
摘要 A measuring device comprises a processing unit, a first antenna adapted to receive a first signal, and a second antenna, adapted to receive a second signal. The processing unit comprises a baseline unit adapted to determine a baseline variance of a first variable and/or a second variable. Moreover, it comprises a variance unit adapted to determine a variance of the first variable and/or the second variable. The first variable and the second variable are each at least initially derived from at least the first signal and the second signal. The processing unit furthermore comprises an error unit, adapted to determine if a systematic error is present, based on the baseline variance and the variance of the first variable and/or the second variable.
申请公布号 US2017094626(A1) 申请公布日期 2017.03.30
申请号 US201615246482 申请日期 2016.08.24
申请人 Rohde & Schwarz GmbH & Co. KG 发明人 BARTKO Hendrik
分类号 H04W56/00;H04W72/04;H04W72/08;H04W24/10 主分类号 H04W56/00
代理机构 代理人
主权项 1. A measuring device comprising: a first antenna configured to receive a first signal, and a second antenna configured to receive a second signal; and a processor configured to determine one or more of a first variable and a second variable based at least in part on the first signal and the second signal, to determine a baseline variance of each of one or more of the first variable and the second variable, to determine a variance of each of one or more of the first variable and the second variable, and to determine a presence or absence of at least one systematic error of the received signals, based on the determined baseline variance(s) of the first variable and the second variable and the determined variance(s) of the first variable and the second variable.
地址 Munich DE