发明名称 ISOLATION STRUCTURES FOR AN INTEGRATED CIRCUIT ELEMENT AND METHOD OF MAKING SAME
摘要 Techniques and mechanisms to provide insulation for a component of an integrated circuit device. In an embodiment, structures of a circuit component are formed in or on a first side of a semiconductor substrate, the structures including a first doped region, a second doped region and a third region between the first doped region and the second doped region. The substrate has formed therein an insulation structure, proximate to the circuit component structures, which is laterally constrained to extend only partially from a location under the circuit component toward an edge of the substrate. In another embodiment, a second side of the substrate − opposite the first side − is exposed by thinning to form the substrate from a wafer. Such thinning enables subsequent back side processing to form a recess in the second side, and to deposit the insulation structure in the recess.
申请公布号 WO2017052616(A1) 申请公布日期 2017.03.30
申请号 WO2015US52324 申请日期 2015.09.25
申请人 INTEL CORPORATION 发明人 LILAK, Aaron, D.;AVCI, Uygar, E.;KENCKE, David, L.;MORROW, Patrick;FOLEY, Kerryann;CEA, Stephen, M.;MEHANDRU, Rishabh
分类号 H01L27/12 主分类号 H01L27/12
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