发明名称 Memory Device Interconnects and Method of Manufacture
摘要 A method of fabricating an integrated circuit memory device including forming a first and second inter-level dielectric layer, an anti-reflective coating layer, and a plurality of electrical connections is disclosed.
申请公布号 US2017092577(A1) 申请公布日期 2017.03.30
申请号 US201615239580 申请日期 2016.08.17
申请人 Cypress Semiconductor Corporation 发明人 Fang Shenqing;Wang Connie Pin-Chin;Yu Wen;WANG Fei
分类号 H01L23/528;H01L27/11524;H01L21/768 主分类号 H01L23/528
代理机构 代理人
主权项
地址 San Jose CA US