发明名称 SPIN HALL EFFECT MAGNETIC RANDOM ACCESS MEMORY BITCELL
摘要 A two-transistor (2T), one magnetic tunnel junction (1MTJ), spin torque transfer (STT), spin Hall effect (SHE), magnetic random access memory (MRAM) may be configured to provide separate write current and read current paths. In such a configuration, the write current may pass through a SHE electrode disposed proximate the MTJ device. The direction of write current flow through the SHE electrode determines spin polarization of the write current, the magnetic field orientation of a free magnetic layer in the MTJ device, and consequently the resistance of the MTJ device. The write current can be at a level sufficient to cause the reliable storage of binary information in the MTJ device. The read current, at a lower level than the write current, passes through the MTJ.
申请公布号 WO2017052542(A1) 申请公布日期 2017.03.30
申请号 WO2015US51824 申请日期 2015.09.24
申请人 INTEL CORPORATION 发明人 WANG, Yih;MANIPATRUNI, Sasikanth;YOUNG, Ian A.
分类号 G11C11/16 主分类号 G11C11/16
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