发明名称 |
Semiconductor Device with Non-Isolated Power Transistor with Integrated Diode Protection |
摘要 |
A semiconductor device configured with one or more integrated breakdown protection diodes in non-isolated power transistor devices and electronic apparatus, and methods for fabricating the devices. |
申请公布号 |
US2017092760(A1) |
申请公布日期 |
2017.03.30 |
申请号 |
US201615378458 |
申请日期 |
2016.12.14 |
申请人 |
NXP USA, Inc. |
发明人 |
Parris Patrice M.;Bode Hubert M.;Chen Weize;DeSouza Richard J.;Laudenbach Andreas;Neugebauer Kurt U. |
分类号 |
H01L29/78;H01L29/36;H01L29/06;H01L29/10;H01L29/08 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
1. A device comprising:
a semiconductor substrate having a first conductivity type; a device separating region in the semiconductor substrate and having a second conductivity type, the device separating region defining an active area and extending in a vertical orientation in the substrate along a periphery of the active area but not extending across the active area in a lateral orientation in the substrate to isolate the active area; a body region in the active area and having the first conductivity type; and a drain region in the active area and having the second conductivity type, the drain region spaced from the body region to define a conduction path of the device; wherein a spacing between the device separating region and the body region establishes a first breakdown voltage lower than a second breakdown voltage in the conduction path. |
地址 |
Austin TX US |