发明名称 BATTERY RELIABILITY ODOMETER
摘要 Various embodiments may be generally directed to techniques for using an observed battery stress history to manage operation of a computing system component in a high power performance mode when powered by a battery. Various embodiments include techniques for tracking stresses to a battery. Various embodiments include techniques for comparing the battery stress history to a degradation baseline for the battery. Various embodiments include techniques for developing a degradation baseline for a battery including, for example, a degradation baseline based on expected stress to a battery and/or a degradation baseline based on a battery reliability model. Various embodiments include techniques for determining a battery stress surplus or deficit. Various embodiments include techniques for managing operation of a performance enhancing mode or high power performance mode of a computing system component based on the determined battery stress surplus or deficit.
申请公布号 US2017092996(A1) 申请公布日期 2017.03.30
申请号 US201514866870 申请日期 2015.09.26
申请人 Intel Corporation 发明人 RODRIGUEZ JORGE P.;UAN-ZO-LI ALEXANDER B.;MATSUMURA NAOKI;KEATES ANDY;HERMERDING, II JAMES G.
分类号 H01M10/48;H02J1/14;G05B15/02 主分类号 H01M10/48
代理机构 代理人
主权项 1. An apparatus, comprising: a variable mode component with multiple operational modes, at least one of which is a higher power performance mode; and logic, at least a portion of which is implemented in hardware, the logic comprising: a battery monitor component to monitor a characteristic of a battery arranged to provide power to the variable mode component;a stress tracking component to determine an accumulated amount of stress to the battery based on the battery characteristic; anda controller component to compare the determined accumulated amount of stress to the battery with an expected amount of stress to the battery, and to regulate operation of the variable mode component in the higher power performance mode based on the comparison.
地址 Santa Clara CA US
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