ADAPTIVE METHOD FOR CALIBRATING MULTIPLE TEMPERATURE SENSORS ON A SINGLE SEMICONDUCTOR DIE

摘要

A system is disclosed, including an interface to a DUT and a testing apparatus. The DUT includes a first plurality of temperature sensing circuits. The testing apparatus may store a plurality of control values. Each control value may depend on at least two calibration values of corresponding temperature sensing circuits of a second plurality of temperature sensing circuits. The testing apparatus may generate a plurality of calibration values for the DUT. Each calibration value corresponds to one of the first plurality of temperature sensing circuits. The testing apparatus may determine a plurality of test values for the DUT. The testing apparatus may calculate a probability value, and repeat generation of the plurality of calibration values upon determining that the probability value is less than a predetermined threshold value. The probability value corresponds to a likelihood that the plurality of calibration values is accurate.

主权项

1. A system, comprising:
an interface configured to communicate to a device under test (DUT), wherein the DUT includes a first plurality of temperature sensing circuits; and a testing apparatus configured to:
store a plurality of control values, wherein each control value of the plurality of control values is dependent upon at least two calibration values of corresponding temperature sensing circuits included in a second plurality of temperature sensing circuits included in a plurality of other devices;wherein a first subset of the second plurality of temperature sensing circuits is located on a first device, and a second subset of the second plurality of temperature sensing circuits is located on a second device;generate a plurality of calibration values for the DUT, wherein each calibration value of the plurality of calibration values corresponds to a respective temperature sensing circuit of the first plurality of temperature sensing circuits;determine a plurality of test values for the DUT, wherein each test value of the plurality of test values corresponds to one or more control values of the plurality of control values;calculate a probability value dependent upon the plurality of test values and the plurality of control values, wherein the probability value corresponds to a likelihood that the plurality of calibration values is accurate based on a predetermined threshold value; andrepeat generation of the plurality of calibration values in response to a determination that the probability value is less than the predetermined threshold value.