CONTOUR GENERATION OF PROMPTED DATA SIGNAL

摘要

The testing of a received data signal accessed from a device under test. Communication circuitry first generates an instruction that causes the device under to emit the data signal towards quality parameter contour generation circuitry. The contour generation circuitry is then configured to generate quality parameter (e.g., bit error ratio) contour of the data signal, which is then received at the contour generation circuitry. The generated contour map may then be evaluated to diagnose the performance of the device under test in emitting the data signal. For instance, each device under test may be evaluated after manufacture. The quality parameter contour generation circuitry may be embedded within an electronic device, such as a consumer electronic device. A diagnostic component within the electronic device is configured to use the quality parameter contour generated by the contour generation circuitry to self-test the device.

主权项

1. A testing device comprising:
an integrated circuit having quality parameter contour generation circuitry configured to generate a quality parameter contour of a data signal received at the contour generation circuitry; and device under test communication circuitry configured to generate an instruction structured to be recognizable by a device under test as triggering the device under test to emit the data signal towards the contour generation circuitry.