发明名称 IN-BAND MARGIN PROBING ON AN OPERATIONAL INTERCONNECT
摘要 There is disclosed in an example an interconnect apparatus having: a root circuit; and a downstream circuit comprising at least one receiver; wherein the root circuit is operable to provide a margin test directive to the downstream circuit during a normal operating state; and the downstream circuit is operable to perform a margin test and provide a result report of the margin test to the root circuit. This may be performed in-band, for example in the L0 state. There is also disclosed a system comprising such an interconnect, and a method of performing margin testing.
申请公布号 WO2017052665(A1) 申请公布日期 2017.03.30
申请号 WO2015US52525 申请日期 2015.09.26
申请人 INTEL CORPORATION;FROELICH, Daniel S.;DAS SHARMA, Debendra;SPAGNA, Fulvio;FORNBERG, Per E.;BRADLEY, David Edward 发明人 FROELICH, Daniel S.;DAS SHARMA, Debendra;SPAGNA, Fulvio;FORNBERG, Per E.;BRADLEY, David Edward
分类号 G06F11/24;G06F11/08;G06F13/14 主分类号 G06F11/24
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