IN-BAND MARGIN PROBING ON AN OPERATIONAL INTERCONNECT
摘要
There is disclosed in an example an interconnect apparatus having: a root circuit; and a downstream circuit comprising at least one receiver; wherein the root circuit is operable to provide a margin test directive to the downstream circuit during a normal operating state; and the downstream circuit is operable to perform a margin test and provide a result report of the margin test to the root circuit. This may be performed in-band, for example in the L0 state. There is also disclosed a system comprising such an interconnect, and a method of performing margin testing.
申请公布号
WO2017052665(A1)
申请公布日期
2017.03.30
申请号
WO2015US52525
申请日期
2015.09.26
申请人
INTEL CORPORATION;FROELICH, Daniel S.;DAS SHARMA, Debendra;SPAGNA, Fulvio;FORNBERG, Per E.;BRADLEY, David Edward
发明人
FROELICH, Daniel S.;DAS SHARMA, Debendra;SPAGNA, Fulvio;FORNBERG, Per E.;BRADLEY, David Edward