发明名称 POLYURETHANE CMP PADS HAVING A HIGH MODULUS RATIO
摘要 A chemical-mechanical polishing pad comprising a polyurethane polishing layer having a high storage modulus at low temperatures and a low storage modulus at high temperatures is disclosed. For example, the disclosed pad embodiments may be fabricated from a thermoplastic polyurethane having a ratio of storage modulus at 25 degrees C. to storage modulus at 80 degrees C. of 50 or more. The thermoplastic polyurethane polishing layer may further optionally have a Shore D hardness of 70 or more, a tensile elongation of 320 percent or less, a storage modulus at 25 degrees C. of 1200 MPa or more, and/or a storage modulus at 80 degrees C. of 15 MPa or less.
申请公布号 US2017087688(A1) 申请公布日期 2017.03.30
申请号 US201615273855 申请日期 2016.09.23
申请人 Cabot Microelectronics Corporation 发明人 FU Lin;Ma Rachel;Speer Nathan;Tsai Chen-Chih;Bergman Kathryn
分类号 B24B37/24;B24B37/04;B24B37/22 主分类号 B24B37/24
代理机构 代理人
主权项 1. A chemical-mechanical polishing pad comprising a thermoplastic polyurethane polishing layer having a ratio of storage modulus at 25 degrees C. to storage modulus at 80 degrees C. of 50 or more.
地址 Aurora IL US