发明名称 |
CORRECTION METHOD FOR DIFFERENTIAL PHASE CONTRAST IMAGING |
摘要 |
The present invention generally refers to a correction method for grating-based X-ray differential phase contrast imaging (DPCI) as well as to an apparatus which can advantageously be applied in X-ray radiography and tomography for hard X-ray DPCI of a sample object or an anatomical region of interest to be scanned. More precisely, the proposed invention provides a suitable approach that helps to enhance the image quality of an acquired X-ray image which is affected by phase wrapping, e.g. in the resulting Moiré interference pattern of an emitted X-ray beam in the detector plane of a Talbot-Lau type interferometer after diffracting said X-ray beam at a phase-shifting beam splitter grating. This problem, which is further aggravated by noise in the obtained DPCI images, occurs if the phase between two adjacent pixels in the detected X-ray image varies by more than &pgr; radians and is effected by a line integration over the object's local phase gradient, which induces a phase offset error of &pgr; radians that leads to prominent line artifacts parallel to the direction of said line integration. |
申请公布号 |
EP2442722(B1) |
申请公布日期 |
2017.03.29 |
申请号 |
EP20100728349 |
申请日期 |
2010.06.10 |
申请人 |
Koninklijke Philips N.V.;Philips Intellectual Property & Standards GmbH |
发明人 |
ENGEL, Klaus, J.;GELLER, Dieter;VOGTMEIER, Gereon |
分类号 |
G21K1/06;A61B6/00;G01N23/04 |
主分类号 |
G21K1/06 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|