发明名称 Particle adsorption probe
摘要 Provided is a novel particle adsorption probe (1000) for picking up a particle by adsorbing the particle. The particle adsorption probe (1000) can selectively pick up a particle having a specific particle diameter from a group of particles having a wide particle diameter distribution without requiring the application of a physical stress in picking up the particle and without contaminating a foreign matter surface in picking up the particle, and allows the particle to be analytically evaluated in an analysis apparatus directly after picking up the particle. The particle adsorption probe (1000) of the present invention includes a carbon nanotube aggregate (100) including a plurality of carbon nanotubes (10).
申请公布号 US9606041(B2) 申请公布日期 2017.03.28
申请号 US201314390429 申请日期 2013.04.09
申请人 NITTO DENKO CORPORATION 发明人 Maeno Youhei;Toyokawa Akiko
分类号 G01N1/02;B25J7/00;G01N15/10;B01L3/02;G01N1/04;G01N1/28;B82Y35/00 主分类号 G01N1/02
代理机构 Sughrue Mion, PLLC 代理人 Sughrue Mion, PLLC
主权项 1. A particle adsorption probe, comprising a carbon nanotube aggregate including a plurality of carbon nanotubes, wherein the carbon nanotube aggregate has diameter of from 10 μm to 500 μm.
地址 Osaka JP