发明名称 Recessed transistors containing ferroelectric material
摘要 Some embodiments include transistor constructions having a first insulative structure lining a recess within a base. A first conductive structure lines an interior of the first insulative structure, and a ferroelectric structure lines an interior of the first conductive structure. A second conductive structure is within a lower region of the ferroelectric structure, and the second conductive structure has an uppermost surface beneath an uppermost surface of the first conductive structure. A second insulative structure is over the second conductive structure and within the ferroelectric structure. A pair of source/drain regions are adjacent an upper region of the first insulative structure and are on opposing sides of the first insulative structure from one another.
申请公布号 US9608111(B2) 申请公布日期 2017.03.28
申请号 US201514850824 申请日期 2015.09.10
申请人 Micro Technology, Inc. 发明人 Ramaswamy Durai Vishak Nirmal
分类号 H01L29/78;H01L27/115;H01L29/49;H01L29/788;H01L29/423;H01L29/51;H01L27/11521;H01L21/28;H01L29/66;H01L27/1159;H01L27/11597 主分类号 H01L29/78
代理机构 Wells St. John P.S. 代理人 Wells St. John P.S.
主权项 1. A transistor construction, comprising: an upwardly-opening container-shaped first insulative structure within a silicon-containing base; an upwardly-opening container-shaped first conductive structure nested within a lower region of the container-shaped first insulative structure; an upwardly-opening container-shaped ferroelectric structure within the first insulative structure and over the first conductive structure; a second conductive structure within a lower region of the container-shaped ferroelectric structure; the second conductive structure having an uppermost surface beneath an uppermost surface of the first conductive structure; a second insulative structure over the second conductive structure and within the container-shaped ferroelectric structure; a pair of source/drain regions adjacent an upper region of the container-shaped first insulative structure and on opposing sides of the first insulative structure from one another; channel material along an outer region of the container-shaped first insulative structure and extending from one of the source/drain regions to the other; wherein the first conductive structure comprises one or both of titanium nitride and tantalum nitride; and wherein the ferroelectric structure comprises metal oxide.
地址 Boise ID US