发明名称 Method and apparatus for searching pattern in sequence data
摘要 A method of searching a pattern in sequence data includes setting a plurality of interest pattern models each including an interest pattern length, an allowed mismatch value, and a minimum support; calculating a support of a candidate pattern that is generable within the interest pattern length based on the allowed mismatch value of at least one of the plurality of interest pattern models; and determining whether the support of the candidate pattern fulfills a condition of the minimum support of at least one of the plurality of interest pattern models.
申请公布号 US9607106(B2) 申请公布日期 2017.03.28
申请号 US201414193320 申请日期 2014.02.28
申请人 Samsung Electronics Co., Ltd. 发明人 Roh Yo-Han;Park Hyoung-Min;Jeon Joo-Hyuk;Hong Seok-Jin
分类号 G06F17/30;G06K9/62;G06F19/24 主分类号 G06F17/30
代理机构 NSIP Law 代理人 NSIP Law
主权项 1. A method of searching a pattern in sequence data, the method comprising: setting a plurality of interest pattern models each comprising an interest pattern length, an allowed mismatch value, and a minimum support; determining a candidate pattern that is within an interest pattern length of at least one of the plurality of interest pattern models; controlling a processor to access a predetermined structure of the sequence data in a memory and calculate a support for the candidate pattern in the sequence data based on an allowed mismatch value of the at least one of the plurality of interest pattern models; and determining whether the support fulfills a condition of the minimum support of the at least one of the plurality of interest pattern models, wherein the determining of whether the support fulfills the condition of the minimum support of the at least one of the plurality of interest pattern models comprises determining, for each of the plurality of interest pattern models, whether a support sum of similar patterns in a set fulfilling a condition of the allowed mismatch value of the interest pattern model fulfills the condition of the minimum support of the interest pattern model.
地址 Suwon-si KR