发明名称 |
Measurement system |
摘要 |
A measurement system, comprising: a first light source that generates first light and irradiates an object with the first light, at least one of an intensity, a polarization state, and a wavelength being modulated with a first period in the first light; a second light source that generates second light, at least one of an intensity, a polarization state, and a wavelength being modulated with a second period in the second light; a first optical system that mixes light from the object based on the first light with the second light; a nonlinear optical crystal that generates third light from the mixed light by sum-frequency generation phenomenon, the third light having a frequency equivalent to a sum of a frequency of the light from the object based on the first light and a frequency of the second light; and a photodetector that measures an intensity of the third light. |
申请公布号 |
US9605998(B2) |
申请公布日期 |
2017.03.28 |
申请号 |
US201514825304 |
申请日期 |
2015.08.13 |
申请人 |
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD. |
发明人 |
Nozawa Katsuya |
分类号 |
G01J1/04;G01S17/32;G01S17/10;G01S17/36;G01S17/89;G01S17/93;G01S7/48;G01S7/487;G01S7/493;G01S7/499;G01S7/491;G02F1/35 |
主分类号 |
G01J1/04 |
代理机构 |
McDermott Will & Emery LLP |
代理人 |
McDermott Will & Emery LLP |
主权项 |
1. A measurement system, comprising:
a first light source that generates first light and irradiates an object with the first light, at least one of an intensity, a polarization state, and a wavelength being modulated with a first period in the first light; a second light source that generates second light, at least one of an intensity, a polarization state, and a wavelength being modulated with a second period in the second light; a first optical system that mixes light from the object based on the first light with the second light to generate mixed light; a nonlinear optical crystal that generates third light from the mixed light by sum-frequency generation phenomenon, the third light having a frequency equivalent to a sum of a frequency of the light from the object based on the first light and a frequency of the second light; and a photodetector that measures an intensity of the third light. |
地址 |
Osaka JP |