发明名称 Integrated circuits with spacer chamfering and methods of spacer chamfering
摘要 Semiconductor devices and methods for forming the devices with spacer chamfering. One method includes, for instance: obtaining a wafer with at least one source, at least one drain, and at least one fin; forming at least one sacrificial gate with at least one barrier layer; forming a first set of spacers adjacent to the at least one sacrificial gate; forming at least one second set of spacers adjacent to the first set of spacers; and etching to remove a portion of the first set of spacers above the at least one barrier layer to form a widened opening. An intermediate semiconductor device is also disclosed.
申请公布号 US9608087(B2) 申请公布日期 2017.03.28
申请号 US201514681428 申请日期 2015.04.08
申请人 GLOBALFOUNDRIES Inc. 发明人 Zang Hui
分类号 H01L21/336;H01L29/66;H01L21/3213;H01L29/78 主分类号 H01L21/336
代理机构 Heslin Rothenberg Farley & Mesiti P.C. 代理人 Heslin Rothenberg Farley & Mesiti P.C. ;Graff Jacquelyn
主权项 1. A method comprising: obtaining a wafer with at least one source, at least one drain, and at least one fin; forming at least one sacrificial gate with at least one barrier layer, comprising: depositing a first polysilicon layer over the wafer;forming the at least one barrier layer over the first polysilicon layer;depositing a second polysilicon layer over the barrier layer; anddepositing a hard mask layer over the second polysilicon layer; forming a first set of spacers adjacent to the at least one sacrificial gate; forming at least one second set of spacers adjacent to the first set of spacers; and etching to remove a portion of the first set of spacers above the at least one barrier layer to form a widened opening.
地址 Grand Cayman KY