发明名称 Grain appearance measuring apparatus
摘要 A technical object is to enable optical checks to be performed while allowing visual checks using a sample pan to be performed in a pseudo manner using an aggregate image (pseudo image) depicting grains loaded on the sample pan, by optically checking the grains using image information on the grains imaged by an imaging apparatus and creating the aggregate image using the image information. Thus, a grain appearance measuring apparatus includes imaging means for imaging a plurality of grains, analysis means for analyzing image information on the grains imaged by the imaging means in units of grains, processing means for processing the image information to form an aggregate image of the grains, and means for saving and/or displaying the aggregate image processed by the processing means. The processing means extracts grain images from the image information in units of grains and arranges the extracted grain images in units of grains, in a close state where the grain images are close to one another to form an aggregate image of the grain images.
申请公布号 US9607368(B2) 申请公布日期 2017.03.28
申请号 US201314411099 申请日期 2013.05.16
申请人 Satake Corporation 发明人 Matsushima Hideaki;Ishizuki Hiroki;Takeuchi Hiroaki
分类号 G06K9/00;G06T7/00;G01N21/85;G06T11/60;G03C8/00 主分类号 G06K9/00
代理机构 Lerner, David, Littenberg, Krumholz & Mentlik, LLP 代理人 Lerner, David, Littenberg, Krumholz & Mentlik, LLP
主权项 1. A grain appearance measuring apparatus comprising: a scanner for imaging a plurality of grains; and a computer configured to: analyze image information on the grains imaged by the scanner in units of grains;process the image information to form an aggregate image of the grains; andsave and/or display the aggregate image,wherein the computer extracts grain images from the image information in units of grains and arranges the extracted grain images in units of grains, in a close state where the grain images are close to one another and/or partly overlap to form an aggregate image of the grain images, and saves and/or displays an image of the aggregate image of the grains on a sample pan.
地址 JP