发明名称 Lithographic apparatus and method of manufacturing a device
摘要 There is disclosed a lithographic apparatus provided with a spectral purity filter which may be provided in one or more of the following locations: (a) in the illumination system, (b) adjacent the patterning device, either a static location in the radiation beam or fixed for movement with the patterning device, (c) in the projection system, and (d) adjacent the substrate table. The spectral purity filter is preferably a membrane formed of polysilicon, a multilayer material, a carbon nanotube material or graphene. The membrane may be provided with a protective capping layer, and/or a thin metal transparent layer.
申请公布号 US9606445(B2) 申请公布日期 2017.03.28
申请号 US201314419425 申请日期 2013.07.30
申请人 ASML Netherlands B.V. 发明人 Banine Vadim Yevgenyevich;Minnaert Arthur Winfried Eduardus;Muitjens Marcel Johannus Elisabeth Hubertus;Yakunin Andrei Mikhailovich;Scaccabarozzi Luigi;Mallmann Hans Joerg;Bal Kurstat;Luijten Carlo Cornelis Maria;Nienhuys Han-Kwang;Huijberts Alexander Marinus Arnoldus;Gasseling Paulus Albertus Maria;Rizo Diago Pedro Julian;Van Kampen Maarten;Van Aerle Nicolaas Aldegonda Jan Maria
分类号 G03F7/20;G21K1/10 主分类号 G03F7/20
代理机构 Sterne, Kessler, Goldstein & Fox P.L.L.C. 代理人 Sterne, Kessler, Goldstein & Fox P.L.L.C.
主权项 1. A lithographic apparatus comprising: an illumination system configured to condition a radiation beam; a support structure configured to support a patterning device; a substrate table configured to hold a substrate; a projection system configured to project a pattern imparted to the radiation beam by the patterning device onto a target portion of the substrate; and a filter adjacent the substrate table and configured to reduce or eliminate deep ultraviolet (DUV) radiation, wherein the filter at least partially closes an opening in the projection system, and wherein the filter comprises a membrane.
地址 Veldhoven NL