发明名称 TILTED-GRATING APPROACH FOR SCANNING-MODE X-RAY GRATING INTERFEROMETRY
摘要 Among the existent X-ray phase-contrast modalities, grating interferometry appears as a promising technique for commercial applications, since it is compatible with conventional X-ray tubes. However, since applications such as medical imaging and homeland security demand covering a considerable field of view, the fabrication of challenging and expensive large-area gratings would be needed. A scanning setup is a good solution, because it uses cheaper line detectors instead of large-area 2D detectors and would require smaller gratings. In this setup, the phase-retrieval using the conventional phase-stepping approach would be slow, so having a faster method to record the signals becomes fundamental. To tackle this problem, a scanning-mode grating interferometer configuration is used, in which a grating is tilted to form Moire fringes perpendicular to the grating lines. The sample is then translated along the fringes, so each line detector records a different phase step for each slice of the sample.
申请公布号 US2017082559(A1) 申请公布日期 2017.03.23
申请号 US201515309222 申请日期 2015.02.25
申请人 PAUL SCHERRER INSTITUT 发明人 ARBOLEDA CAROLINA;STAMPANONI MARCO;WANG ZHENTIAN
分类号 G01N23/083;G21K1/06;G01N23/04 主分类号 G01N23/083
代理机构 代理人
主权项
地址 VILLIGEN PSI CH