发明名称 Ion Source Alignment
摘要 An ion analysis instrument is disclosed comprising an indicator device for providing an indication of a relative positioning of an ion source, a sample, and/or a sampling orifice or capillary of an ion analysis instrument such as a mass or ion mobility spectrometer in order to facilitate re-alignment of one or more of these components following a change. The indicator device comprises a source of electromagnetic radiation such as a pair of lasers or image projection devices.
申请公布号 US2017082435(A1) 申请公布日期 2017.03.23
申请号 US201615267677 申请日期 2016.09.16
申请人 Micromass UK Limited 发明人 Towers Mark;Murray Paul
分类号 G01C15/00;H01J49/16;H01J49/14;H01J49/02;H01J49/00;H01J49/04 主分类号 G01C15/00
代理机构 代理人
主权项 1. An ion analysis instrument comprising: an ion source for generating ions from a sample; a sampling orifice or capillary for receiving ions generated by said ion source through which ions pass, in use, towards an analyser; and an indicator device comprising one or more sources of electromagnetic radiation for providing an indication of a relative positioning of said ion source and/or said sample and/or said sampling orifice or capillary.
地址 Wilmslow GB