发明名称 |
Ion Source Alignment |
摘要 |
An ion analysis instrument is disclosed comprising an indicator device for providing an indication of a relative positioning of an ion source, a sample, and/or a sampling orifice or capillary of an ion analysis instrument such as a mass or ion mobility spectrometer in order to facilitate re-alignment of one or more of these components following a change. The indicator device comprises a source of electromagnetic radiation such as a pair of lasers or image projection devices. |
申请公布号 |
US2017082435(A1) |
申请公布日期 |
2017.03.23 |
申请号 |
US201615267677 |
申请日期 |
2016.09.16 |
申请人 |
Micromass UK Limited |
发明人 |
Towers Mark;Murray Paul |
分类号 |
G01C15/00;H01J49/16;H01J49/14;H01J49/02;H01J49/00;H01J49/04 |
主分类号 |
G01C15/00 |
代理机构 |
|
代理人 |
|
主权项 |
1. An ion analysis instrument comprising:
an ion source for generating ions from a sample; a sampling orifice or capillary for receiving ions generated by said ion source through which ions pass, in use, towards an analyser; and an indicator device comprising one or more sources of electromagnetic radiation for providing an indication of a relative positioning of said ion source and/or said sample and/or said sampling orifice or capillary. |
地址 |
Wilmslow GB |