发明名称 |
SEMICONDUCTOR DEVICE HAVING INTERCONNECT LAYER THAT INCLUDES DIELECTRIC SEGMENTS INTERLEAVED WITH METAL COMPONENTS |
摘要 |
An interconnect layer is disposed over a substrate. The interconnect layer includes a plurality of dielectric segments interleaved with a plurality of metal components. A plurality of vias is disposed below, and electrically coupled to, a first group of the metal components. A plurality of dielectric components is disposed underneath a second group of the metal components. The dielectric components interleave with the vias. A conductive liner is disposed below a bottom surface and on sidewalk of the vias. A dielectric barrier layer is disposed below a bottom surface and on sidewalls of the dielectric segments. The dielectric barrier layer and the dielectric segments have different material compositions. |
申请公布号 |
US2017084485(A1) |
申请公布日期 |
2017.03.23 |
申请号 |
US201615370016 |
申请日期 |
2016.12.06 |
申请人 |
Taiwan Semiconductor Manufacturing Co., Ltd. |
发明人 |
Lin Chun-Chieh;Su Hung-Wen;Tsai Ming-Hsing;Jang Syun-Ming |
分类号 |
H01L21/768;H01L23/528;H01L23/532;H01L23/522 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device, comprising:
an interconnect layer disposed over a substrate, wherein: the interconnect layer includes a plurality of dielectric segments and a plurality of metal components; a plurality of vias disposed below, and electrically coupled to, a first group of the metal components; a plurality of dielectric components disposed underneath a second group of the metal components; and a conductive liner disposed underneath the vias and between the vias and the dielectric components. |
地址 |
Hsin-Chu TW |