发明名称 SEMICONDUCTOR DEVICE HAVING INTERCONNECT LAYER THAT INCLUDES DIELECTRIC SEGMENTS INTERLEAVED WITH METAL COMPONENTS
摘要 An interconnect layer is disposed over a substrate. The interconnect layer includes a plurality of dielectric segments interleaved with a plurality of metal components. A plurality of vias is disposed below, and electrically coupled to, a first group of the metal components. A plurality of dielectric components is disposed underneath a second group of the metal components. The dielectric components interleave with the vias. A conductive liner is disposed below a bottom surface and on sidewalk of the vias. A dielectric barrier layer is disposed below a bottom surface and on sidewalls of the dielectric segments. The dielectric barrier layer and the dielectric segments have different material compositions.
申请公布号 US2017084485(A1) 申请公布日期 2017.03.23
申请号 US201615370016 申请日期 2016.12.06
申请人 Taiwan Semiconductor Manufacturing Co., Ltd. 发明人 Lin Chun-Chieh;Su Hung-Wen;Tsai Ming-Hsing;Jang Syun-Ming
分类号 H01L21/768;H01L23/528;H01L23/532;H01L23/522 主分类号 H01L21/768
代理机构 代理人
主权项 1. A semiconductor device, comprising: an interconnect layer disposed over a substrate, wherein: the interconnect layer includes a plurality of dielectric segments and a plurality of metal components; a plurality of vias disposed below, and electrically coupled to, a first group of the metal components; a plurality of dielectric components disposed underneath a second group of the metal components; and a conductive liner disposed underneath the vias and between the vias and the dielectric components.
地址 Hsin-Chu TW