发明名称 Highly Scaled Tunnel FET With Tight Pitch and Method to Fabricate Same
摘要 A structure includes a substrate and a tunnel field effect transistor (TFET). The TFET includes a source region disposed in the substrate having an overlying source contact, the source region containing first semiconductor material having a first doping type; a drain region disposed in the substrate having an overlying drain contact, the drain region containing second semiconductor material having a second, opposite doping type; and a gate structure that overlies a channel region between the source and the drain. The source region and the drain region are asymmetric with respect to one another such that one contains a larger volume of semiconductor material than the other one. A method is disclosed to fabricate a plurality of the TFETs using a plurality of spaced apart mandrels having spacers. A pair of the mandrels and the associated spacers is processed to form four adjacent TFETs without requiring intervening lithographic processes.
申请公布号 US2017084726(A1) 申请公布日期 2017.03.23
申请号 US201615070501 申请日期 2016.03.15
申请人 International Business Machines Corporation 发明人 Balakrishnan Karthik;Cheng Kangguo;Hashemi Pouya;Reznicek Alexander
分类号 H01L29/66;H01L29/06;H01L29/10;H01L29/78;H01L27/088;H01L29/167;H01L29/51;H01L29/49;H01L29/45;H01L29/08;H01L29/161 主分类号 H01L29/66
代理机构 代理人
主权项 1. A structure, comprising: a substrate; and a tunnel field effect transistor (TFET) comprised of a source region disposed in the substrate and having an overlying source contact, the source region comprised of first semiconductor material having a first doping type, a drain region disposed in the substrate and having an overlying drain contact, the drain region comprised of second semiconductor material having a second doping type opposite the first doping type, and a gate structure that overlies a channel region disposed between the source region and the drain region; where the source region and the drain region are asymmetric with respect to one another and one of the source region and the drain region contains a larger volume of semiconductor material than the other one of the source region and drain region.
地址 Armonk NY US