发明名称 |
Highly Scaled Tunnel FET With Tight Pitch and Method to Fabricate Same |
摘要 |
A structure includes a substrate and a tunnel field effect transistor (TFET). The TFET includes a source region disposed in the substrate having an overlying source contact, the source region containing first semiconductor material having a first doping type; a drain region disposed in the substrate having an overlying drain contact, the drain region containing second semiconductor material having a second, opposite doping type; and a gate structure that overlies a channel region between the source and the drain. The source region and the drain region are asymmetric with respect to one another such that one contains a larger volume of semiconductor material than the other one. A method is disclosed to fabricate a plurality of the TFETs using a plurality of spaced apart mandrels having spacers. A pair of the mandrels and the associated spacers is processed to form four adjacent TFETs without requiring intervening lithographic processes. |
申请公布号 |
US2017084726(A1) |
申请公布日期 |
2017.03.23 |
申请号 |
US201615070501 |
申请日期 |
2016.03.15 |
申请人 |
International Business Machines Corporation |
发明人 |
Balakrishnan Karthik;Cheng Kangguo;Hashemi Pouya;Reznicek Alexander |
分类号 |
H01L29/66;H01L29/06;H01L29/10;H01L29/78;H01L27/088;H01L29/167;H01L29/51;H01L29/49;H01L29/45;H01L29/08;H01L29/161 |
主分类号 |
H01L29/66 |
代理机构 |
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代理人 |
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主权项 |
1. A structure, comprising:
a substrate; and a tunnel field effect transistor (TFET) comprised of a source region disposed in the substrate and having an overlying source contact, the source region comprised of first semiconductor material having a first doping type, a drain region disposed in the substrate and having an overlying drain contact, the drain region comprised of second semiconductor material having a second doping type opposite the first doping type, and a gate structure that overlies a channel region disposed between the source region and the drain region; where the source region and the drain region are asymmetric with respect to one another and one of the source region and the drain region contains a larger volume of semiconductor material than the other one of the source region and drain region. |
地址 |
Armonk NY US |