发明名称 STACKED NANOWIRE DEVICE WIDTH ADJUSTMENT BY GAS CLUSTER ION BEAM (GCIB)
摘要 A method of making a nanowire device incudes disposing a first nanowire stack over a substrate, the first nanowire stack including alternating layers of a first and second semiconducting material, the first semiconducting material contacting the substrate and the second semiconducting material being an exposed surface; disposing a second nanowire stack over the substrate, the second nanowire stack including alternating layers of the first and second semiconducting materials, the first semiconducting material contacting the substrate and the second semiconducting material being an exposed surface; forming a first gate spacer along a sidewall of a first gate region on the first nanowire stack and a second gate spacer along a sidewall of a second gate region on the second nanowire stack; oxidizing a portion of the first nanowire stack within the first gate spacer; and removing the first semiconducting material from the first nanowire stack and the second nanowire stack.
申请公布号 US2017084690(A1) 申请公布日期 2017.03.23
申请号 US201615202983 申请日期 2016.07.06
申请人 International Business Machines Corporation ;GlobalFoundries, Inc. 发明人 Cheng Kangguo;Miao Xin;Xie Ruilong;Yamashita Tenko
分类号 H01L29/06;H01L29/66;H01L29/423;H01L21/02 主分类号 H01L29/06
代理机构 代理人
主权项 1. A method of making a nanowire device, the method comprising: disposing a nanowire stack of a transistor over a substrate, the nanowire stack comprising alternating layers of a first semiconducting material and a second semiconducting material, the first semiconducting material contacting the substrate and the second semiconducting material being an exposed surface of the nanowire stack; forming a gate spacer along a sidewall of a gate region on the nanowire stack; oxidizing a portion of the nanowire stack within the gate spacer; and removing the first semiconducting material from the nanowire stack.
地址 Armonk NY US