发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 According to an embodiment, a semiconductor memory device comprises: a first wiring line; a memory string connected to this first wiring line; and a plurality of second wiring lines connected to this memory string. In addition, this memory string comprises: a first semiconductor layer connected to the first wiring line; a plurality of second semiconductor layers connected to this first semiconductor layer; and a variable resistance element connected between this second semiconductor layer and the second wiring line. Moreover, of the first semiconductor layer and the plurality of second semiconductor layers, one includes a semiconductor of a first conductivity type, and the other includes a semiconductor of a second conductivity type.
申请公布号 US2017084329(A1) 申请公布日期 2017.03.23
申请号 US201615070382 申请日期 2016.03.15
申请人 Kabushiki Kaisha Toshiba 发明人 TOKUHIRA Hiroki;TANIMOTO Hiroyoshi;IZUMIDA Takashi
分类号 G11C13/00;H01L27/24;H01L45/00;H01L23/528 主分类号 G11C13/00
代理机构 代理人
主权项 1. A semiconductor memory device, comprising: a first wiring line; a memory string connected to the first wiring line; and a plurality of second wiring lines connected to the memory string, the memory string comprising: a first semiconductor layer connected to the first wiring line; a plurality of second semiconductor layers connected to the first semiconductor layer; and a variable resistance element connected between the second semiconductor layer and the second wiring line, the first semiconductor layer including a semiconductor of a first conductivity type, and the plurality of second semiconductor layers including a semiconductor of a second conductivity type.
地址 Minato-ku JP