发明名称 |
SEMICONDUCTOR MEMORY DEVICE |
摘要 |
According to an embodiment, a semiconductor memory device comprises: a first wiring line; a memory string connected to this first wiring line; and a plurality of second wiring lines connected to this memory string. In addition, this memory string comprises: a first semiconductor layer connected to the first wiring line; a plurality of second semiconductor layers connected to this first semiconductor layer; and a variable resistance element connected between this second semiconductor layer and the second wiring line. Moreover, of the first semiconductor layer and the plurality of second semiconductor layers, one includes a semiconductor of a first conductivity type, and the other includes a semiconductor of a second conductivity type. |
申请公布号 |
US2017084329(A1) |
申请公布日期 |
2017.03.23 |
申请号 |
US201615070382 |
申请日期 |
2016.03.15 |
申请人 |
Kabushiki Kaisha Toshiba |
发明人 |
TOKUHIRA Hiroki;TANIMOTO Hiroyoshi;IZUMIDA Takashi |
分类号 |
G11C13/00;H01L27/24;H01L45/00;H01L23/528 |
主分类号 |
G11C13/00 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor memory device, comprising:
a first wiring line; a memory string connected to the first wiring line; and a plurality of second wiring lines connected to the memory string, the memory string comprising: a first semiconductor layer connected to the first wiring line; a plurality of second semiconductor layers connected to the first semiconductor layer; and a variable resistance element connected between the second semiconductor layer and the second wiring line, the first semiconductor layer including a semiconductor of a first conductivity type, and the plurality of second semiconductor layers including a semiconductor of a second conductivity type. |
地址 |
Minato-ku JP |