DATA PROCESSING SYSTEM WITH BUILT-IN SELF-TEST AND METHOD THEREFOR

摘要

A scan circuit and methods of operating a scan circuit are provided. The method for operating a scan circuit includes providing a first scan flip-flop which includes an overwrite feature. With the overwrite feature enabled, a change in functional behavior of the first scan flip-flop occurs based on a control signal. The method may further include capturing data at a first input of the first scan flip-flop during a first state of the control signal and resetting captured data by using the overwrite feature during a first transition of the control signal. The method my further include forming a scan chain with one or more of the first scan flip-flops and one or more second scan flip-flops. The second scan flip-flops may include a similar overwrite feature, having the overwrite feature disabled.

主权项

1. A method for operating a scan circuit, the method comprising:
providing a first scan flip-flop including an overwrite feature, the overwrite feature being enabled; capturing data at a first input of the first scan flip-flop during a first state of a control signal; and using the overwrite feature to overwrite a logic value at an output of the first scan flip-flop based on the control signal.