发明名称 |
METHOD OF ANALYSIS OF COMPONENT IN SAMPLE, METHOD OF SPECIFIC ISOLATION OF COMPONENT IN SAMPLE, AND SAMPLE FOR MASS SPECTROMETRY |
摘要 |
A trace component in a sample is quickly and accurately analyzed using a small sample quantity without performing preprocessing such as concentration.;Trace components in a sample can be analyzed quickly and accurately using a small sample quantity and without preprocessing such as concentration, by a method for analyzing a component in a sample, the method including a step for irradiating a thermoplastic resin film internally containing the sample with ionizing laser light of a mass spectrometer. |
申请公布号 |
US2017082579(A1) |
申请公布日期 |
2017.03.23 |
申请号 |
US201515311556 |
申请日期 |
2015.05.12 |
申请人 |
National University Corporation Nagoya University |
发明人 |
SAWADA Makoto |
分类号 |
G01N27/64;H01J49/16 |
主分类号 |
G01N27/64 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
Aichi JP |