发明名称 METHOD OF ANALYSIS OF COMPONENT IN SAMPLE, METHOD OF SPECIFIC ISOLATION OF COMPONENT IN SAMPLE, AND SAMPLE FOR MASS SPECTROMETRY
摘要 A trace component in a sample is quickly and accurately analyzed using a small sample quantity without performing preprocessing such as concentration.;Trace components in a sample can be analyzed quickly and accurately using a small sample quantity and without preprocessing such as concentration, by a method for analyzing a component in a sample, the method including a step for irradiating a thermoplastic resin film internally containing the sample with ionizing laser light of a mass spectrometer.
申请公布号 US2017082579(A1) 申请公布日期 2017.03.23
申请号 US201515311556 申请日期 2015.05.12
申请人 National University Corporation Nagoya University 发明人 SAWADA Makoto
分类号 G01N27/64;H01J49/16 主分类号 G01N27/64
代理机构 代理人
主权项
地址 Aichi JP