发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 Provided is a semiconductor device with improved performance. The semiconductor device includes a photodiode having a charge storage layer (n-type semiconductor region) and a surface layer (p-type semiconductor region), and a transfer transistor having a gate electrode and a floating diffusion. The surface layer (p-type semiconductor region) of a second conductive type formed over the charge storage layer (n-type semiconductor region) of a first conductive type includes a first sub-region having a low impurity concentration, and a second sub-region having a high impurity concentration. The first sub-region is arranged closer to the floating diffusion than the second sub-region.
申请公布号 US2017084658(A1) 申请公布日期 2017.03.23
申请号 US201615364456 申请日期 2016.11.30
申请人 Renesas Electronics Corporation 发明人 KAMINO Takeshi;GOTO Yotaro
分类号 H01L27/146 主分类号 H01L27/146
代理机构 代理人
主权项
地址 Tokyo JP