发明名称 Active Device Which Has A High Breakdown Voltage, Is Memory-Less, Traps Even Harmonic Signals And Circuits Used Therewith
摘要 An active device and circuits utilized therewith are disclosed. In an aspect, the active device comprises an n-type transistor having a drain, gate and bulk and a p-type transistor having a drain, gate and bulk. The n-type transistor and the p-type transistor include a common source. The device includes a first capacitor coupled between the gate of the n-type transistor and the gate of the p-type transistor, a second capacitor coupled between the drain of the n-type transistor and the drain of p-type transistor and a third capacitor coupled between the bulk of the n-type transistor and the bulk of p-type transistor. The active device has a high breakdown voltage, is memory less and traps even harmonic signals.
申请公布号 US2017085237(A1) 申请公布日期 2017.03.23
申请号 US201615367995 申请日期 2016.12.02
申请人 Project FT, Inc. 发明人 Aram Farbod
分类号 H03G1/00;H03F3/193;H03F3/21;H03F1/32;H03F3/45 主分类号 H03G1/00
代理机构 代理人
主权项 1. An active device comprises: an n type transistor having a drain, gate and bulk; a p-type transistor having a drain, gate and bulk; wherein then-type transistor and the p-type transistor share a common source; a first capacitor coupled between the gate of n-type transistor and the gate of p-type transistor; a second capacitor coupled between the drain of n-type transistor and the drain of p-type transistor; and a third capacitor coupled between the bulk of n-type transistor and the bulk of p-type transistor; wherein the active device has a high breakdown voltage, is memory less and traps even harmonic signals.
地址 Mountain View CA US