发明名称 |
Active Device Which Has A High Breakdown Voltage, Is Memory-Less, Traps Even Harmonic Signals And Circuits Used Therewith |
摘要 |
An active device and circuits utilized therewith are disclosed. In an aspect, the active device comprises an n-type transistor having a drain, gate and bulk and a p-type transistor having a drain, gate and bulk. The n-type transistor and the p-type transistor include a common source. The device includes a first capacitor coupled between the gate of the n-type transistor and the gate of the p-type transistor, a second capacitor coupled between the drain of the n-type transistor and the drain of p-type transistor and a third capacitor coupled between the bulk of the n-type transistor and the bulk of p-type transistor. The active device has a high breakdown voltage, is memory less and traps even harmonic signals. |
申请公布号 |
US2017085237(A1) |
申请公布日期 |
2017.03.23 |
申请号 |
US201615367995 |
申请日期 |
2016.12.02 |
申请人 |
Project FT, Inc. |
发明人 |
Aram Farbod |
分类号 |
H03G1/00;H03F3/193;H03F3/21;H03F1/32;H03F3/45 |
主分类号 |
H03G1/00 |
代理机构 |
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代理人 |
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主权项 |
1. An active device comprises:
an n type transistor having a drain, gate and bulk; a p-type transistor having a drain, gate and bulk; wherein then-type transistor and the p-type transistor share a common source; a first capacitor coupled between the gate of n-type transistor and the gate of p-type transistor; a second capacitor coupled between the drain of n-type transistor and the drain of p-type transistor; and a third capacitor coupled between the bulk of n-type transistor and the bulk of p-type transistor; wherein the active device has a high breakdown voltage, is memory less and traps even harmonic signals. |
地址 |
Mountain View CA US |