DETECTING CIRCUIT DESIGN FLAWS BASED ON TIMING ANALYSIS

摘要

An end point report for a design of an electronic circuit may be analyzed. Results of a static timing analysis run are loaded, a path from the loaded results is selected, and technology specific context data is provided. Additionally, a determination is made for every test point of the selected path of design quality parameters for determining a design problem area, and a determination is made for every design problem area, of a root cause by analyzing design problem area data in comparison to related ones of the technology specific context data.

主权项

1. A computer-implemented method of analyzing an end point report for a design of an electronic circuit, the computer-implemented method comprising:
loading, in a processing device, results of a static timing analysis run; selecting, by the processing device, a path from said loaded results; providing technology specific context data; determining, by the processing device, for one or more test points of the selected path, design quality parameters for determining a design problem area; and determining, for the design problem area, a root cause by analyzing design problem area data in comparison to related ones of said technology specific context data.