发明名称 SEMICONDUCTOR DEVICES INCLUDING A DUMMY GATE STRUCTURE ON A FIN
摘要 Semiconductor devices including a dummy gate structure on a fin are provided. A semiconductor device includes a fin protruding from a substrate. The semiconductor device includes a source/drain region in the fin, and a recess region of the fin that is between first and second portions of the source/drain region. Moreover, the semiconductor device includes a dummy gate structure overlapping the recess region, and a spacer that is on the fin and adjacent a sidewall of the dummy gate structure.
申请公布号 US2017084617(A1) 申请公布日期 2017.03.23
申请号 US201615371751 申请日期 2016.12.07
申请人 Samsung Electronics Co., Ltd. 发明人 Park Sang-Jine;Kwon Kee-Sang;Kim Do-Hyoung;Yoon Bo-Un;Bai Keun-Hee;Yang Kwang-Yong;Yeo Kyoung-Hwan;Jeon Yong-Ho
分类号 H01L27/11;H01L27/088;H01L21/762;H01L21/8234 主分类号 H01L27/11
代理机构 代理人
主权项 1. A semiconductor device comprising: a substrate comprising a first region and a second region; a first fin protruding from the substrate and extending in a first direction on the first region; a recess extending in a second direction different from the first direction in the first fin; a dummy gate structure overlapping the recess and extending in the second direction; second and third fins on the second region, protruding from the substrate, and extending in the first direction; and a trench between the second fin and the third fin such that the second fin and the third fin are spaced apart from each other, wherein a height and a width of the recess are smaller than those of the trench.
地址 Suwon-si KR