发明名称 REPAIR CIRCUIT, SEMICONDUCTOR APPARATUS AND SEMICONDUCTOR SYSTEM USING THE SAME
摘要 A repair circuit may be provided. The repair circuit may include a latch array including a plurality of latch sets. The repair circuit may include a fuse array including a plurality of fuse sets, and configured to be written, in each fuse set, with repair address data and latch address data which defines a position of a latch set where the repair address data is to be stored, among the plurality of latch sets. The repair circuit may include a first decoder configured to cause data written in any one fuse set among the plurality of fuse sets to be outputted, and a second decoder configured to cause the repair address data to be stored in the latch set corresponding to the latch address data among the plurality of latch sets.
申请公布号 US2017083398(A1) 申请公布日期 2017.03.23
申请号 US201615048226 申请日期 2016.02.19
申请人 SK hynix Inc. 发明人 BAEK Young Hyun
分类号 G06F11/07;G11C29/44 主分类号 G06F11/07
代理机构 代理人
主权项 1. A repair circuit comprising: a latch array including a plurality of latch sets; a fuse array including a plurality of fuse sets, and configured to be written, in each fuse set, with repair address data and latch address data which defines a position of a latch set where the repair address data is to be stored, among the plurality of latch sets; a first decoder configured to cause data written in any one fuse set among the plurality of fuse sets to be outputted; and a second decoder configured to cause the repair address data to be stored in the latch set corresponding to the latch address data among the plurality of latch sets.
地址 Icheon-si Gyeonggi-do KR