发明名称 |
REPAIR CIRCUIT, SEMICONDUCTOR APPARATUS AND SEMICONDUCTOR SYSTEM USING THE SAME |
摘要 |
A repair circuit may be provided. The repair circuit may include a latch array including a plurality of latch sets. The repair circuit may include a fuse array including a plurality of fuse sets, and configured to be written, in each fuse set, with repair address data and latch address data which defines a position of a latch set where the repair address data is to be stored, among the plurality of latch sets. The repair circuit may include a first decoder configured to cause data written in any one fuse set among the plurality of fuse sets to be outputted, and a second decoder configured to cause the repair address data to be stored in the latch set corresponding to the latch address data among the plurality of latch sets. |
申请公布号 |
US2017083398(A1) |
申请公布日期 |
2017.03.23 |
申请号 |
US201615048226 |
申请日期 |
2016.02.19 |
申请人 |
SK hynix Inc. |
发明人 |
BAEK Young Hyun |
分类号 |
G06F11/07;G11C29/44 |
主分类号 |
G06F11/07 |
代理机构 |
|
代理人 |
|
主权项 |
1. A repair circuit comprising:
a latch array including a plurality of latch sets; a fuse array including a plurality of fuse sets, and configured to be written, in each fuse set, with repair address data and latch address data which defines a position of a latch set where the repair address data is to be stored, among the plurality of latch sets; a first decoder configured to cause data written in any one fuse set among the plurality of fuse sets to be outputted; and a second decoder configured to cause the repair address data to be stored in the latch set corresponding to the latch address data among the plurality of latch sets. |
地址 |
Icheon-si Gyeonggi-do KR |