发明名称 DITHER MASK GENERATION METHOD AND DEVICE
摘要 The dither mask generation method includes: a process of setting a nozzle relative ejection rate which is a control target of the nozzle ejection rate and stipulates a relative using ratio of the individual nozzles; a process of setting a nozzle pattern indicating correspondence relation between individual pixels of the dither mask and the nozzles in charge of recording at respective pixel positions; a process of setting an upper limit to the nozzle ejection rates of the individual nozzles for each raster in a main scanning direction, regarding at least some thresholds; and a process of setting the thresholds to the pixels of the dither mask based on the nozzle relative ejection rate, the nozzle pattern and a limitation by the upper limit.
申请公布号 US2017085750(A1) 申请公布日期 2017.03.23
申请号 US201615267653 申请日期 2016.09.16
申请人 FUJIFILM Corporation 发明人 KATSUYAMA Kimito
分类号 H04N1/405;B41J2/045 主分类号 H04N1/405
代理机构 代理人
主权项 1. A dither mask generation method used in halftone processing, the method comprising: a nozzle relative ejection rate setting process of setting a nozzle relative ejection rate which is a control target of a nozzle ejection rate of each nozzle indicating a ratio of recording pixels for which each nozzle ejects ink to record a dot, in recording attending pixels allocated to each nozzle as pixels for which each of a plurality of nozzles in a recording head having the plurality of nozzles that eject ink is in charge of recording, and which stipulates a relative using ratio of the individual nozzles; a nozzle pattern setting process of setting a nozzle pattern indicating correspondence relation between the individual pixels of the dither mask and the nozzles in charge of recording at respective pixel positions; a nozzle ejection rate limiting process of setting an upper limit lower than a highest nozzle ejection rate to the nozzle ejection rates of the individual nozzles for each raster for the individual rasters in a main scanning direction, regarding at least some thresholds set to the individual pixels of the dither mask; and a threshold setting process of setting the thresholds to the pixels of the dither mask based on the nozzle relative ejection rate, the nozzle pattern and a limitation by the upper limit.
地址 Tokyo JP