发明名称 SEMICONDUCTOR DEVICE AND METHOD OF FORMING CANTILEVERED PROTRUSION ON A SEMICONDUCTOR DIE
摘要 A semiconductor device has a first semiconductor die with a base material. A covering layer is formed over a surface of the base material. The covering layer can be made of an insulating material or metal. A trench is formed in the surface of the base material. The covering layer extends into the trench to provide the cantilevered protrusion of the covering layer. A portion of the base material is removed by plasma etching to form a cantilevered protrusion extending beyond an edge of the base material. The cantilevered protrusion can be formed by removing the base material to the covering layer, or the cantilevered protrusion can be formed within the base material under the covering layer. A second semiconductor die is disposed partially under the cantilevered protrusion. An interconnect structure is formed between the cantilevered protrusion and second semiconductor die.
申请公布号 US2017084520(A1) 申请公布日期 2017.03.23
申请号 US201615231025 申请日期 2016.08.08
申请人 SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC 发明人 CARNEY Francis J.;SEDDON Michael J.
分类号 H01L23/495;H01L21/3065;H01L21/78 主分类号 H01L23/495
代理机构 代理人
主权项 1. A method of making a semiconductor device, comprising: providing a first semiconductor die including a base material; forming a covering layer over a surface of the base material; and removing a portion of the base material to form a cantilevered protrusion of the covering layer extending beyond an edge of the base material.
地址 Phoenix AZ US