发明名称 STRUCTURE FOR RADIOFREQUENCY APPLICATIONS AND PROCESS FOR MANUFACTURING SUCH A STRUCTURE
摘要 The invention relates to a structure (100) for radiofrequency applications comprising: - a monocrystalline substrate (1), - a polycrystalline silicon layer (2) directly on the monocrystalline substrate (1), - an active layer (3) on the polycrystalline silicon layer (2), intended to receive radiofrequency components, characterized in that at least a first portion (2a) of the polycrystalline silicon layer (2) extending from the interface (I) of the polycrystalline silicon layer (2) with the monocrystalline layer includes carbon and/or nitrogen atoms located at the grain boundaries of the polycrystalline silicon. The invention further relates to a process for manufacturing such a structure.
申请公布号 EP3144958(A1) 申请公布日期 2017.03.22
申请号 EP20150306431 申请日期 2015.09.17
申请人 Soitec;PEREGRINE SEMICONDUCTOR CORPORATION 发明人 NGUYEN, Bich-Yen;MALEVILLE, Christophe;GOKTEPELI, Sinan;MISCIONE, Anthony Mark;DUVALLET, Alain
分类号 H01L21/20;H01L21/02;H01L21/762 主分类号 H01L21/20
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