发明名称 |
STRUCTURE FOR RADIOFREQUENCY APPLICATIONS AND PROCESS FOR MANUFACTURING SUCH A STRUCTURE |
摘要 |
The invention relates to a structure (100) for radiofrequency applications comprising:
- a monocrystalline substrate (1),
- a polycrystalline silicon layer (2) directly on the monocrystalline substrate (1),
- an active layer (3) on the polycrystalline silicon layer (2), intended to receive radiofrequency components,
characterized in that at least a first portion (2a) of the polycrystalline silicon layer (2) extending from the interface (I) of the polycrystalline silicon layer (2) with the monocrystalline layer includes carbon and/or nitrogen atoms located at the grain boundaries of the polycrystalline silicon. The invention further relates to a process for manufacturing such a structure. |
申请公布号 |
EP3144958(A1) |
申请公布日期 |
2017.03.22 |
申请号 |
EP20150306431 |
申请日期 |
2015.09.17 |
申请人 |
Soitec;PEREGRINE SEMICONDUCTOR CORPORATION |
发明人 |
NGUYEN, Bich-Yen;MALEVILLE, Christophe;GOKTEPELI, Sinan;MISCIONE, Anthony Mark;DUVALLET, Alain |
分类号 |
H01L21/20;H01L21/02;H01L21/762 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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