发明名称 Sequential frequency band acquisition apparatus for test and measurement instrument
摘要 An acquisition apparatus for a test and measurement instrument includes an input to receive an input signal, a digitizer to digitize a selected signal, a bypass path to selectively couple the input to the digitizer, a frequency shift path to frequency shift the input signal and selectively couple the frequency-shifted input signal to the digitizer, the frequency shift path including a means for frequency shifting, an input switch to switch the input signal to one of the bypass path and the frequency shift path, and an output switch to provide the selected signal to the digitizer by selectively coupling an output of one of the frequency shift path and the bypass path to the digitizer.
申请公布号 EP1717592(B1) 申请公布日期 2017.03.22
申请号 EP20060252292 申请日期 2006.04.28
申请人 Tektronix, Inc. 发明人 Pickerd, John J.
分类号 G01R13/34;G01R13/02 主分类号 G01R13/34
代理机构 代理人
主权项
地址