发明名称 半導体装置の製造方法、クリーニング方法および基板処理装置並びにプログラム
摘要 Provided is a method of manufacturing a semiconductor device, which efficiently removes a high permittivity film (high-k film). The method of manufacturing a semiconductor device includes: (a) supplying a processing gas containing an organic compound into a process chamber to form a predetermined film on a substrate; (b) supplying a first cleaning gas into the process chamber with the substrate being unloaded from the process chamber to remove films adhered to an inner wall of a reaction tube defining the process chamber and members disposed in the process chamber; (c) supplying a modifying gas into the process chamber after performing (b) to modify a carbon-containing film remaining in a nozzle of the members configured to supply the processing gas; and (d) supplying a second cleaning gas into the process chamber to remove a film obtained by modifying the carbon-containing film in (c).
申请公布号 JP6101113(B2) 申请公布日期 2017.03.22
申请号 JP20130039089 申请日期 2013.02.28
申请人 株式会社日立国際電気 发明人 山崎 裕久
分类号 H01L21/31;C23C16/44 主分类号 H01L21/31
代理机构 代理人
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