| 摘要 |
In an invariant relation analysis, a capability to detect abnormalities is improved and erroneous abnormality reports are reduced. A system analysis device (100) includes a correlation model generation unit (130) and a learning reliability calculation unit (140). The correlation model generation unit (130) generates, based on time series of a plurality of metrics in a system in a learning period, a correlation model that includes a correlation between metrics. The learning reliability calculation unit (140) calculates learning reliability of the correlation, based on a behavior of a time series of each of metrics relevant to the correlation included in the correlation model, in the learning period. |
