发明名称 Manufacturing method of array substrate
摘要 The present invention provides a manufacturing method of an array substrate, comprising steps of: forming a gate and a gate line on a substrate; forming a gate insulating layer on the gate and the gate line; forming a pixel electrode on the gate insulating layer; and forming a first connecting via in a portion of the gate insulating layer in a non-display region and corresponding to the gate line, wherein the first connecting via is configured to connect a scanning signal trace to the gate line.
申请公布号 US9601528(B2) 申请公布日期 2017.03.21
申请号 US201615133737 申请日期 2016.04.20
申请人 BOE TECHNOLOGY GROUP CO., LTD.;BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD. 发明人 Zhang Pengju;Du Xiaojian;Gao Bo;Ye Han
分类号 H01L27/12;H01L21/027;H01L21/311;H01L21/02;H01L29/51;H01L29/423 主分类号 H01L27/12
代理机构 Nath, Goldberg & Meyer 代理人 Nath, Goldberg & Meyer ;Goldberg Joshua B.
主权项 1. A manufacturing method of an array substrate, comprising steps of: forming a gate and a gate line on a substrate; forming a gate insulating layer on the gate and the gate line; forming a pixel electrode on the gate insulating layer; and forming a first connecting via in a portion of the gate insulating layer in a non-display region and corresponding to the gate line, wherein the first connecting via is configured to connect a scanning signal trace to the gate line, wherein, the step of forming a first connecting via in a portion of the gate insulating layer in a non-display region and corresponding to the gate line comprises steps of: coating a layer of photoresist on the pixel electrode and the gate insulating layer; exposing the photoresist with a mask and developing the photoresist, such that a portion of the photoresist in a display region and on the pixel electrode is removed partially or completely, and a portion of the photoresist in the non-display region and corresponding to the gate line is removed completely; etching the gate insulating layer to form the first connecting via in a portion of the gate insulating layer in the non-display region and corresponding to the gate line; and stripping off residual photoresist.
地址 Beijing CN
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