发明名称 |
Manufacturing method of array substrate |
摘要 |
The present invention provides a manufacturing method of an array substrate, comprising steps of: forming a gate and a gate line on a substrate; forming a gate insulating layer on the gate and the gate line; forming a pixel electrode on the gate insulating layer; and forming a first connecting via in a portion of the gate insulating layer in a non-display region and corresponding to the gate line, wherein the first connecting via is configured to connect a scanning signal trace to the gate line. |
申请公布号 |
US9601528(B2) |
申请公布日期 |
2017.03.21 |
申请号 |
US201615133737 |
申请日期 |
2016.04.20 |
申请人 |
BOE TECHNOLOGY GROUP CO., LTD.;BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD. |
发明人 |
Zhang Pengju;Du Xiaojian;Gao Bo;Ye Han |
分类号 |
H01L27/12;H01L21/027;H01L21/311;H01L21/02;H01L29/51;H01L29/423 |
主分类号 |
H01L27/12 |
代理机构 |
Nath, Goldberg & Meyer |
代理人 |
Nath, Goldberg & Meyer ;Goldberg Joshua B. |
主权项 |
1. A manufacturing method of an array substrate, comprising steps of:
forming a gate and a gate line on a substrate; forming a gate insulating layer on the gate and the gate line; forming a pixel electrode on the gate insulating layer; and forming a first connecting via in a portion of the gate insulating layer in a non-display region and corresponding to the gate line, wherein the first connecting via is configured to connect a scanning signal trace to the gate line, wherein, the step of forming a first connecting via in a portion of the gate insulating layer in a non-display region and corresponding to the gate line comprises steps of: coating a layer of photoresist on the pixel electrode and the gate insulating layer; exposing the photoresist with a mask and developing the photoresist, such that a portion of the photoresist in a display region and on the pixel electrode is removed partially or completely, and a portion of the photoresist in the non-display region and corresponding to the gate line is removed completely; etching the gate insulating layer to form the first connecting via in a portion of the gate insulating layer in the non-display region and corresponding to the gate line; and stripping off residual photoresist. |
地址 |
Beijing CN |