发明名称 Gate-all-around semiconductor device and method of fabricating the same
摘要 The disclosed technology generally relates to semiconductor devices and more particularly to a gate-all-around semiconductor device, and methods of fabricating the same. In one aspect, the method comprises providing on a semiconductor substrate between STI regions at least one suspended nanostructure anchored by a source region and a drain region. The suspended nanostructure is formed of a crystalline semiconductor material that is different from a crystalline semiconductor material of the semiconductor substrate. A gate stack surrounds the at least one suspended nanostructure.
申请公布号 US9601488(B2) 申请公布日期 2017.03.21
申请号 US201615138056 申请日期 2016.04.25
申请人 IMEC VZW 发明人 Waldron Niamh;Merckling Clement;Collaert Nadine
分类号 H01L29/41;H01L27/088;B82Y10/00;B82Y40/00;H01L29/66;H01L29/775;H01L29/06;H01L29/10;H01L29/20;H01L29/04;H01L29/423;H01L29/78;H01L29/40;H01L21/02 主分类号 H01L29/41
代理机构 Knobbe, Martens, Olson & Bear LLP 代理人 Knobbe, Martens, Olson & Bear LLP
主权项 1. A semiconductor device comprising: a semiconductor substrate comprising a crystalline semiconductor material; at least one suspended nanostructure extending in a first direction and formed at least partially above and between a pair of adjacent STI regions, the at least one suspended nanostructure being electrically connected to and mechanically supported by a source region and a drain region formed at opposite ends of the at least one suspended nanostructure in the first direction, wherein the at least one suspended nanostructure comprises a crystalline semiconductor material that is different from the crystalline semiconductor material of the semiconductor substrate; a cavity formed vertically between the at least one suspended nanostructure and the semiconductor substrate and laterally between sidewalls of the STI regions facing each other; and a gate stack surrounding the suspended nanostructure, wherein the gate stack extends to cover a top surface and the sidewalls of the STI regions and an exposed surface of the semiconductor substrate in the cavity.
地址 Leuven BE