发明名称 Composite semiconductor device with different channel widths
摘要 A device includes a semiconductor substrate, a first constituent transistor including a first plurality of transistor structures in the semiconductor substrate connected in parallel with one another, and a second constituent transistor including a second plurality of transistor structures in the semiconductor substrate connected in parallel with one another. The first and second constituent transistors are disposed laterally adjacent to one another and connected in parallel with one another. Each transistor structure of the first plurality of transistor structures has a lower resistance in a saturation region of operation than each transistor structure of the second plurality of transistor structures.
申请公布号 US9601614(B2) 申请公布日期 2017.03.21
申请号 US201514669415 申请日期 2015.03.26
申请人 NXP USA, INC. 发明人 Min Won Gi;Rodriquez Pete;Yang Hongning;Zuo Jiang-Kai
分类号 H01L29/78;H01L27/02;H01L29/08;H01L29/66;H01L29/06;H01L29/10 主分类号 H01L29/78
代理机构 代理人
主权项 1. A device comprising: a semiconductor substrate; a first constituent transistor comprising a first plurality of transistor structures in the semiconductor substrate connected in parallel with one another; and a second constituent transistor comprising a second plurality of transistor structures in the semiconductor substrate connected in parallel with one another; wherein the first and second constituent transistors are disposed laterally adjacent to one another and connected in parallel with one another; wherein each transistor structure of the first and second pluralities of transistor structures comprises a plurality of source regions and a plurality of body contact regions disposed in an alternating arrangement with the plurality of source regions along a lateral dimension of the device; and wherein each transistor structure of the first plurality of transistor structures has a lower resistance in a saturation region of operation than each transistor structure of the second plurality of transistor structures due to a layout difference in the alternating arrangement between the first and second pluralities of transistor structures.
地址 Austin TX US