发明名称 |
Semiconductor device having elevated structure |
摘要 |
A semiconductor device includes a gate stack overlying a substrate. The semiconductor device further includes a spacer on sidewalls of the gate stack, where a top surface of the spacer is above a top surface of the gate stack. Additionally, the semiconductor device includes a protection layer overlying the gate stack and filling at least a portion of a space surrounded by the spacer above the top surface of the gate stack. Furthermore, the semiconductor device includes a contact hole over the spacer, where the contact hole extends over the gate stack, and where a sidewall of the contact hole has a step-wise shape. |
申请公布号 |
US9601587(B2) |
申请公布日期 |
2017.03.21 |
申请号 |
US201514603861 |
申请日期 |
2015.01.23 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
发明人 |
Sun Sey-Ping;Lee Tsung-Lin;Lin Chin-Hsiang;Chang Chih-Hao;Yeh Chen-Nan;Jong Chao-An |
分类号 |
H01L29/423;H01L21/768;H01L29/49;H01L29/78;H01L29/66 |
主分类号 |
H01L29/423 |
代理机构 |
Hauptman Ham, LLP |
代理人 |
Hauptman Ham, LLP |
主权项 |
1. A semiconductor device comprising:
a gate stack overlying a substrate; a spacer on sidewalls of the gate stack, wherein a top surface of the spacer is above a top surface of the gate stack; a continuous protection layer overlying the gate stack and completely filling a space surrounded by the spacer above the top surface of the gate stack, wherein the continuous protection layer is in direct contact with the substrate; and a contact hole over the spacer, wherein the contact hole extends over the gate stack, and wherein a sidewall of the contact hole has a step-wise shape, wherein an outer surface of the spacer forms an interface with the contact hole. |
地址 |
TW |