发明名称 |
Systems and methods for measuring current with shielded conductors |
摘要 |
Systems and methods for measuring current with shielded conductors are provided. One system includes a first wire within shielding, wherein the first wire is connected between a high voltage source and a filament of an x-ray system. The system also includes a second wire within shielding, wherein the second wire is connected between the high voltage source and the x-ray system and the shielding of the first and second wires is at a high voltage potential of the x-ray system. The system further includes a measurement resistor at a high voltage potential, wherein the measurement resistor is connected between the shielding and one of the first or second wires. |
申请公布号 |
US9603230(B2) |
申请公布日期 |
2017.03.21 |
申请号 |
US201314095724 |
申请日期 |
2013.12.03 |
申请人 |
General Electric |
发明人 |
Wiedmann Uwe;Baptiste George William |
分类号 |
H05G1/26;G01R19/00;G01R1/20 |
主分类号 |
H05G1/26 |
代理机构 |
|
代理人 |
Dobson Melissa K. |
主权项 |
1. A measurement system comprising:
a first wire within shielding, the first wire connected between a high voltage source and a filament of an x-ray system; a second wire within shielding, the second wire connected between the high voltage source and the x-ray system, wherein the shielding of the first and second wires is at a high voltage potential of the x-ray system; a measurement resistor having at least one end at the high voltage potential, the measurement resistor connected between the shielding and one of the first or second wires; and additional shielding surrounding the shielding of the first and second wires. |
地址 |
Niskayuna NY US |