主权项 |
1. A method for testing a semiconductor device, the method comprising:
positioning a probe card comprising a plurality of probes above the semiconductor device; and moving the probe card in a vertical direction towards the semiconductor device, wherein the moving comprises moving in a vertical direction towards a plurality of electrical structures of the semiconductor device until each probe of the plurality of probes has made mechanical contact with a corresponding electrical structure of the plurality of electrical structures with a prescribed quantity of force, wherein each probe of the plurality of probes absorbs a portion of vertical overdrive after contacting its corresponding electrical structure, and wherein the probe card absorbs any remaining vertical overdrive, and wherein vertical overdrive is a continuing vertical movement of the plurality of probes after a first probe of the plurality of probes mechanically contacts a first corresponding electrical structure. |