发明名称 Method of fabricating a bond pad structure
摘要 A method of forming a bond pad structure is provided. The method includes forming a first conductive layer over a substrate and depositing a first dielectric layer over the first conductive layer. The first dielectric layer is patterned to form a contiguous planar path substantially parallel to a top surface of the substrate. Patterning the first dielectric layer includes defining a dielectric region of the first dielectric layer surrounded by a portion of the contiguous planar path, and forming a first via hole in the dielectric region. The contiguous planar path and the via hole are filled with a conductive material. The conductive material in the contiguous planar path forms a second conductive layer, and the contiguous planar path extends from a first lateral side wall of the second conductive layer to a second lateral sidewall of the second conductive layer. A bond pad is formed over the second conductive layer, and the bond pad is electrically connected to the second conductive layer.
申请公布号 US9601446(B2) 申请公布日期 2017.03.21
申请号 US201514657789 申请日期 2015.03.13
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Jeng Shin-Puu;Chen Hsien-Wei;Tsai Hao-Yi;Liu Yu-Wen
分类号 H01L29/40;H01L23/00 主分类号 H01L29/40
代理机构 Haynes and Boone, LLP 代理人 Haynes and Boone, LLP
主权项 1. A method of fabricating a semiconductor device, comprising: forming a first conductive layer disposed over a substrate; depositing a first dielectric layer over the first conductive layer; patterning the first dielectric layer to form a contiguous planar path substantially parallel to a top surface of the substrate, wherein the patterning includes: defining a first dielectric region of the first dielectric layer surrounded by the contiguous planar path;defining a second dielectric region of the first dielectric layer surrounded by the contiguous planar path, wherein the first and second dielectric regions are separated by the contiguous planar path; andforming a first via hole in the first dielectric region; filling the contiguous planar path and the first via hole with a conductive material, wherein the conductive material in the contiguous planar path forms a second conductive layer, wherein the contiguous planar path extends from a first lateral side wall of the second conductive layer to a second lateral sidewall of the second conductive layer; and forming a bond pad over the second conductive layer, wherein the bond pad is electrically connected to the second conductive layer.
地址 Hsin-Chu TW