发明名称 CMOS-BASED SEMICONDUCTOR DEVICE ON MICRO-HOTPLATE AND METHOD OF FABRICATION
摘要 It is disclosed herein a semiconductor device and a method of manufacturing the semiconductor device. The semiconductor device is made using partly CMOS or CMOS based processing steps, and it includes a semiconductor substrate, a dielectric region over the semiconductor substrate, a heater within the dielectric region and a patterned layer of noble metal above the dielectric region. The method includes the deposition of a photoresist material over the dielectric region, and patterning the photo-resist material to form a patterned region over the dielectric region. The steps of depositing the photo-resist material and patterning the photo-resist material may be performed in sequence using similar photolithography and etching steps to those used in a CMOS process. The resulting semiconductor device is then subjected to further processing steps which ensure that a dielectric membrane and a metal structure within the membrane are formed in the patterned region over the dielectric region.
申请公布号 US2017074815(A1) 申请公布日期 2017.03.16
申请号 US201515123630 申请日期 2015.02.27
申请人 Cambridge CMOS Sensors Limited 发明人 UDREA Florin;ALI Syed Zeeshan;GARDNER Julian
分类号 G01N27/04;H05B3/26;G01N33/00;H05B3/14 主分类号 G01N27/04
代理机构 代理人
主权项 1. A method of manufacturing a microhotplate comprising a semiconductor substrate, a dielectric region over the semiconductor substrate, a resistive heater within the dielectric region, the method comprising: forming the semiconductor substrate, the dielectric region and the resistive heater using complementary metal oxide semiconductor, CMOS, compatible processing steps; depositing a photo-resist material over the dielectric region using the CMOS compatible processing steps; patterning the photo-resist material to form a patterned region over the dielectric region using the CMOS compatible processing steps; etching at least a portion of the semiconductor substrate to form a dielectric membrane, wherein the steps of depositing the photo-resist material, patterning the photo-resist material and etching the portion of the semiconductor substrate are performed in sequence; and subjecting the dielectric membrane to a further process which ensures that a metal structure is deposited in the patterned region over the dielectric region.
地址 Cambridge GB