发明名称 |
CMOS-BASED SEMICONDUCTOR DEVICE ON MICRO-HOTPLATE AND METHOD OF FABRICATION |
摘要 |
It is disclosed herein a semiconductor device and a method of manufacturing the semiconductor device. The semiconductor device is made using partly CMOS or CMOS based processing steps, and it includes a semiconductor substrate, a dielectric region over the semiconductor substrate, a heater within the dielectric region and a patterned layer of noble metal above the dielectric region. The method includes the deposition of a photoresist material over the dielectric region, and patterning the photo-resist material to form a patterned region over the dielectric region. The steps of depositing the photo-resist material and patterning the photo-resist material may be performed in sequence using similar photolithography and etching steps to those used in a CMOS process. The resulting semiconductor device is then subjected to further processing steps which ensure that a dielectric membrane and a metal structure within the membrane are formed in the patterned region over the dielectric region. |
申请公布号 |
US2017074815(A1) |
申请公布日期 |
2017.03.16 |
申请号 |
US201515123630 |
申请日期 |
2015.02.27 |
申请人 |
Cambridge CMOS Sensors Limited |
发明人 |
UDREA Florin;ALI Syed Zeeshan;GARDNER Julian |
分类号 |
G01N27/04;H05B3/26;G01N33/00;H05B3/14 |
主分类号 |
G01N27/04 |
代理机构 |
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代理人 |
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主权项 |
1. A method of manufacturing a microhotplate comprising a semiconductor substrate, a dielectric region over the semiconductor substrate, a resistive heater within the dielectric region, the method comprising:
forming the semiconductor substrate, the dielectric region and the resistive heater using complementary metal oxide semiconductor, CMOS, compatible processing steps; depositing a photo-resist material over the dielectric region using the CMOS compatible processing steps; patterning the photo-resist material to form a patterned region over the dielectric region using the CMOS compatible processing steps; etching at least a portion of the semiconductor substrate to form a dielectric membrane, wherein the steps of depositing the photo-resist material, patterning the photo-resist material and etching the portion of the semiconductor substrate are performed in sequence; and subjecting the dielectric membrane to a further process which ensures that a metal structure is deposited in the patterned region over the dielectric region. |
地址 |
Cambridge GB |