发明名称 SEMICONDUCTOR DEVICE WITH GATE INSIDE U-SHAPED CHANNEL AND METHODS OF MAKING SUCH A DEVICE
摘要 One illustrative method disclosed herein includes, among other things, forming a trench in a semiconductor substrate, forming a liner semiconductor material above the entire interior surface of the trench, the liner semiconductor material defining a transistor cavity, forming a gate structure that is at least partially positioned within the transistor cavity, and performing at least one epitaxial deposition process to form a source region structure and a drain region structure on opposite sides of the gate structure, wherein at least a portion of each of the source region structure and the drain region structure is positioned within the transistor cavity.
申请公布号 US2017077297(A1) 申请公布日期 2017.03.16
申请号 US201514853012 申请日期 2015.09.14
申请人 GLOBALFOUNDRIES Inc. 发明人 Pawlak Bartlomiej Jan
分类号 H01L29/78;H01L29/423;H01L29/66 主分类号 H01L29/78
代理机构 代理人
主权项 1. A method of forming a transistor device, said transistor device having a channel region and a gate width direction, the method comprising: forming a trench in a semiconductor substrate, said trench having an interior surface; forming a liner semiconductor material above the entire interior surface of said trench, said liner semiconductor material defining a transistor cavity; forming a gate structure that is at least partially positioned within said transistor cavity; and performing at least one epitaxial deposition process to form a source region structure and a drain region structure on opposite sides of said gate structure, wherein at least a portion of each of said source region structure and said drain region structure is positioned within said transistor cavity.
地址 Grand Cayman KY