发明名称 |
SEMICONDUCTOR DEVICE WITH GATE INSIDE U-SHAPED CHANNEL AND METHODS OF MAKING SUCH A DEVICE |
摘要 |
One illustrative method disclosed herein includes, among other things, forming a trench in a semiconductor substrate, forming a liner semiconductor material above the entire interior surface of the trench, the liner semiconductor material defining a transistor cavity, forming a gate structure that is at least partially positioned within the transistor cavity, and performing at least one epitaxial deposition process to form a source region structure and a drain region structure on opposite sides of the gate structure, wherein at least a portion of each of the source region structure and the drain region structure is positioned within the transistor cavity. |
申请公布号 |
US2017077297(A1) |
申请公布日期 |
2017.03.16 |
申请号 |
US201514853012 |
申请日期 |
2015.09.14 |
申请人 |
GLOBALFOUNDRIES Inc. |
发明人 |
Pawlak Bartlomiej Jan |
分类号 |
H01L29/78;H01L29/423;H01L29/66 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
1. A method of forming a transistor device, said transistor device having a channel region and a gate width direction, the method comprising:
forming a trench in a semiconductor substrate, said trench having an interior surface; forming a liner semiconductor material above the entire interior surface of said trench, said liner semiconductor material defining a transistor cavity; forming a gate structure that is at least partially positioned within said transistor cavity; and performing at least one epitaxial deposition process to form a source region structure and a drain region structure on opposite sides of said gate structure, wherein at least a portion of each of said source region structure and said drain region structure is positioned within said transistor cavity. |
地址 |
Grand Cayman KY |