发明名称 STRUCTURE AND METHOD OF OPERATION FOR IMPROVED GATE CAPACITY FOR 3D NOR FLASH MEMORY
摘要 Embodiments of the present invention provide improved three-dimensional memory cells, arrays, devices, and/or the like and associated methods. In one embodiment, a three-dimensional memory cell is provided. The three-dimensional memory cell comprises a first conductive layer; a third conductive layer spaced apart from the first conductive layer; a channel conductive layer connecting the first conductive layer and the third conductive layer to form an opening having internal surfaces; a dielectric layer disposed along the internal surfaces of the opening surrounded by the first conductive layer, the channel conductive layer and the third conductive layer; and a second conductive layer interposed and substantially filling a remaining open portion formed by the dielectric layer. The first conductive layer, the dielectric layer, and the second conductive layer are configured to form a staircase structure.
申请公布号 US2017077118(A1) 申请公布日期 2017.03.16
申请号 US201514854383 申请日期 2015.09.15
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 CHENG CHENG-HSIEN;LEE CHIH-WEI;KU SHAW-HUNG;LU WEN-PIN
分类号 H01L27/115 主分类号 H01L27/115
代理机构 代理人
主权项 1. A three-dimensional memory cell comprising: a first conductive layer; a third conductive layer spaced apart from the first conductive layer; a channel conductive layer connecting the first conductive layer and the third conductive layer to form an opening having internal surfaces; a dielectric layer disposed along the internal surfaces of the opening surrounded by the first conductive layer, the channel conductive layer and the third conductive layer; and a second conductive layer interposed and substantially filling a remaining open portion formed by the dielectric layer, wherein the first conductive layer, the dielectric layer, and the second conductive layer are configured to form a staircase structure.
地址 Hsin-Chu TW