发明名称 INTERCONNECTION STRUCTURE, FABRICATING METHOD THEREOF, AND SEMICONDUCTOR DEVICE USING THE SAME
摘要 A semiconductor device includes a semiconductor substrate, a contact region present in the semiconductor substrate, and a silicide present on a textured surface of the contact region. A plurality of sputter ions are present between the silicide and the contact region. Since the surface of the contact region is textured, the contact area provided by the silicide is increased accordingly, thus the resistance of a interconnection structure in the semiconductor device is reduced.
申请公布号 US2017077033(A1) 申请公布日期 2017.03.16
申请号 US201614993024 申请日期 2016.01.11
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LIN Yu-Hung;LIU Chi-Wen;TSENG Horng-Huei
分类号 H01L23/535;H01L23/532;H01L21/768 主分类号 H01L23/535
代理机构 代理人
主权项 1. A semiconductor device comprising: a semiconductor substrate; a contact region present in the semiconductor substrate, wherein the contact region comprises a textured surface; a silicide present on the contact region; and a plurality of sputter residues present between the silicide and the contact region.
地址 HSINCHU TW